Query_Lang-PCBFunctions_Fields_TestpointFabTestpointFab_AD
Created: 9月 02, 2015 | Updated: 8月 19, 2021
| Applies to versions: 1.0, 1.1, 2.0, 2.1, 3.0, 3.1 and 3.2
現在、バージョン 2.0. をご覧頂いています。最新情報については、バージョン Query_Lang-PCBFunctions_Fields_TestpointFab((TestpointFab))_AD の 4 をご覧ください。
Parent page: PCB Query Functions - Fields
Summary
Pad and via objects can be used as fabrication and/or assembly testpoints, and on the top and/or bottom of the board. This function returns pad and via objects whose Fabrication Testpoint - Top or Fabrication Testpoint - Bottom properties comply with the Query.
Syntax
TestpointFab : Boolean
Example Usage
TestpointFab
TestpointFab
= True
Returns all pad and via objects whose Fabrication Testpoint - Top or Fabrication Testpoint - Bottom properties are enabled.
Not TestpointFab
TestpointFab = False
Returns all objects except pad and via objects whose Fabrication Testpoint - Top or Fabrication Testpoint - Bottom properties are enabled.
Tips
- The Fabrication Testpoint - Top and Fabrication Testpoint - Bottom properties are only defined for pad and via objects.