Query_Lang-PCBFunctions_Fields_TespointTestpoint_AD

Created: September 02, 2015 | Updated: August 19, 2021 | Applies to versions: 1.0, 1.1, 2.0, 2.1, 3.0, 3.1 and 3.2

Now reading version 1.0. For the latest, read: Query_Lang-PCBFunctions_Fields_Tespoint((Testpoint))_AD for version 4

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Parent page: PCB Query Functions - Fields

Summary

Pad and via objects can be used as fabrication and/or assembly testpoints, and on the top and/or bottom of the board. This function returns pad and via objects whose Fabrication Testpoint - Top, Fabrication Testpoint - Bottom, Assembly Testpoint - Top, or Assembly Testpoint - Bottom properties comply with the Query.

Syntax

Testpoint : Boolean

Example Usage

Testpoint
Testpoint = True
Returns all pad and via objects having any of their Fabrication Testpoint - Top, Fabrication Testpoint - Bottom, Assembly Testpoint - Top, or Assembly Testpoint - Bottom properties enabled.

Not Testpoint
Testpoint = False
Returns all objects except pad and via objects having any of their Fabrication Testpoint - Top, Fabrication Testpoint - Bottom, Assembly Testpoint - Top, or Assembly Testpoint - Bottom properties enabled.

Tips

The Fabrication Testpoint - Top, Fabrication Testpoint - Bottom, Assembly Testpoint - Top, and Assembly Testpoint - Bottom properties are only defined for pad and via objects.

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